Additive manufacturing (AM) encompasses a suite of layer-by-layer fabrication techniques that enable the rapid production of complex geometries from digital models. Central to the industrial adoption ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...

Google today announced the launch of Visual Inspection AI, a new Google Cloud Platform (GCP) solution designed to help manufacturers, consumer packaged goods companies, and other businesses reduce ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Nearly 8 percent of lithium-ion batteries from questionable low-cost brands could have dangerous manufacturing defects. Nearly 8 percent of lithium-ion batteries from questionable low-cost brands ...