IC manufacturers are increasingly relying on intelligent data processing to prevent downtime, improve yields, and reduce scrap. They are integrating that with fault detection and classification (FDC) ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

AWARE uses waveform signatures to detect and classify early-stage grid faults, enabling proactive intervention. The system combines physics-based models with AI/ML to interpret subtle electrical ...

Learn about the methodology and tools for AI-driven arc fault detection to create real-time classification on MCUs, improving ...

Rotating machinery, including critical components such as gears, bearings, and planetary systems, serves as the backbone of modern industrial equipment, ...