Power management in contemporary system-on-chip (SoC) designs is almost unimaginably complex. Processors and other chip cores turn on and off as needed. Advanced features such as dynamic voltage and ...

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...

Before we go forward and run some of the tests that we are going to see hereinafter, let us check a few of the symptoms to understand if those tests are worth doing. We have mentioned some symptoms ...

AUSTIN, Texas--(BUSINESS WIRE)--NI (NASDAQ: NATI) today announced its latest product advancements designed to fuel innovation across the production process, from testing and validation to R&D and ...

A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.

As newer devices operate at ever-escalating power levels, controlling temperature during test gets tougher. These challenges may be difficult, but some solutions are developing. Low-cost burn-in with ...